The Diabetes Technology Society Error Grid and Trend Accuracy Matrix for Glucose Monitors.
Klonoff DC, Freckmann G, Pleus S, Kovatchev BP, Kerr D, Tse CC, Li C, Agus MSD, Dungan K, Voglová Hagerf B, Krouwer JS, Lee WA, Misra S, Rhee SY, Sabharwal A, Seley JJ, Shah VN, Tran NK, Waki K, Worth C, Tian T, Aaron RE, Rutledge K, Ho CN, Ayers AT, Adler A, Ahn DT, Aktürk HK, Al-Sofiani ME, Bailey TS, Baker M, Bally L, Bannuru RR, Bauer EM, Bee YM, Blanchette JE, Cengiz E, Chase JG, Y Chen K, Cherñavvsky D, Clements M, Cote GL, Dhatariya KK, Drincic A, Ejskjaer N, Espinoza J, Fabris C, Fleming GA, Gabbay MAL, Galindo RJ, Gómez-Medina AM, Heinemann L, Hermanns N, Hoang T, Hussain S, Jacobs PG, Jendle J, Joshi SR, Koliwad SK, Lal RA, Leiter LA, Lind M, Mader JK, Maran A, Masharani U, Mathioudakis N, McShane M, Mehta C, Moon SJ, Nichols JH, O'Neal DN, Pasquel FJ, Peters AL, Pfützner A, Pop-Busui R, Ranjitkar P, Rhee CM, Sacks DB, Schmidt S, Schwaighofer SM, Sheng B, Simonson GD, Sode K, Spanakis EK, Spartano NL, Umpierrez GE, Vareth M, Vesper HW, Wang J, Wright E, Wu AHB, Yeshiwas S, Zilbermint M, Kohn MA.
Klonoff DC, et al. Among authors: yeshiwas s.
J Diabetes Sci Technol. 2024 Nov;18(6):1346-1361. doi: 10.1177/19322968241275701. Epub 2024 Oct 6.
J Diabetes Sci Technol. 2024.
PMID: 39369312
