Estimating Per-Class Statistics for Label Noise Learning.
Luo W, Chen S, Liu T, Han B, Niu G, Sugiyama M, Tao D, Gong C.
Luo W, et al. Among authors: liu t.
IEEE Trans Pattern Anal Mach Intell. 2024 Sep 23;PP. doi: 10.1109/TPAMI.2024.3466182. Online ahead of print.
IEEE Trans Pattern Anal Mach Intell. 2024.
PMID: 39312440