Twice reflected ultrasonic bulk wave for surface defect monitoring.
Wong VK, Li X, Yousry YM, Philibert M, Jiang C, Lim DBK, Christopher Subhodayam PT, Fan Z, Yao K.
Wong VK, et al. Among authors: jiang c.
Ultrasonics. 2024 Nov 26;147:107530. doi: 10.1016/j.ultras.2024.107530. Online ahead of print.
Ultrasonics. 2024.
PMID: 39612893