Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.
Liu F, Li M, Diao Q, Li Z, Shen Z, Li F, Hong Z, Lian H, Yue S, Hou Q, Zhang C, Zhang D, Li C, Yang F, Yang J.
Liu F, et al. Among authors: li f, li c, li z, li m.
J Synchrotron Radiat. 2024 Sep 1;31(Pt 5):1146-1153. doi: 10.1107/S1600577524006222. Epub 2024 Jul 29.
J Synchrotron Radiat. 2024.
PMID: 39073994
Free PMC article.