Khursheed A - Search Results

1

Quantitative material analysis using secondary electron energy spectromicroscopy.

Han W, Zheng M, Banerjee A, Luo YZ, Shen L, Khursheed A. Han W, et al. Among authors: khursheed a. Sci Rep. 2020 Dec 17;10(1):22144. doi: 10.1038/s41598-020-78973-0. Sci Rep. 2020. PMID: 33335154 Free PMC article.

2

Author Correction: Quantitative material analysis using secondary electron energy spectromicroscopy.

Han W, Zheng M, Banerjee A, Luo YZ, Shen L, Khursheed A. Han W, et al. Among authors: khursheed a. Sci Rep. 2021 Apr 1;11(1):7626. doi: 10.1038/s41598-021-87188-w. Sci Rep. 2021. PMID: 33795803 Free PMC article. No abstract available.

3

Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures.

Srinivasan A, Han W, Khursheed A. Srinivasan A, et al. Among authors: khursheed a. Microsc Microanal. 2018 Oct;24(5):453-460. doi: 10.1017/S1431927618015052. Epub 2018 Oct 2. Microsc Microanal. 2018. PMID: 30277195

4

Fluorescence Invigoration in Carbon-Incorporated Zinc Oxide Nanowires from Passage of Field Emission Electrons.

Bah A, Lim KY, Wei F, Khursheed A, Sow CH. Bah A, et al. Among authors: khursheed a. Sci Rep. 2019 Jul 4;9(1):9671. doi: 10.1038/s41598-019-46177-w. Sci Rep. 2019. PMID: 31273272 Free PMC article.

5

The Design of a Reflection Electron Energy Loss Spectrometer Attachment for Low Voltage Scanning Electron Microscopy.

Chuah J, Khursheed A. Chuah J, et al. Among authors: khursheed a. Materials (Basel). 2021 Dec 7;14(24):7511. doi: 10.3390/ma14247511. Materials (Basel). 2021. PMID: 34947108 Free PMC article.

6

Brightness measurement of an electron impact gas ion source for proton beam writing applications.

Liu N, Xu X, Pang R, Raman PS, Khursheed A, van Kan JA. Liu N, et al. Among authors: khursheed a. Rev Sci Instrum. 2016 Feb;87(2):02A903. doi: 10.1063/1.4932005. Rev Sci Instrum. 2016. PMID: 26931964

7

Redesign of the scanning electron microscope for parallel energy spectral acquisition.

Khursheed A, Hoang HQ. Khursheed A, et al. Ultramicroscopy. 2008 Jan;108(2):151-7. doi: 10.1016/j.ultramic.2007.04.001. Epub 2007 Apr 12. Ultramicroscopy. 2008. PMID: 17499926

8

Probing and analyzing buried interfaces of multifunctional oxides using a secondary electron energy analyzer.

Srinivasan A, Khursheed A. Srinivasan A, et al. Among authors: khursheed a. Microsc Microanal. 2014 Oct;20(5):1494-8. doi: 10.1017/S1431927614012781. Epub 2014 Jul 17. Microsc Microanal. 2014. PMID: 25032674

9

A high signal-to-noise ratio toroidal electron spectrometer for the SEM.

Hoang HQ, Osterberg M, Khursheed A. Hoang HQ, et al. Among authors: khursheed a. Ultramicroscopy. 2011 Jul;111(8):1093-100. doi: 10.1016/j.ultramic.2011.06.003. Epub 2011 Jun 28. Ultramicroscopy. 2011. PMID: 21740873

10

A high-resolution add-on in-lens attachment for scanning electron microscopes.

Khursheed A, Karuppiah N, Koh SH. Khursheed A, et al. Scanning. 2001 May-Jun;23(3):204-10. doi: 10.1002/sca.4950230307. Scanning. 2001. PMID: 11405306

Save citations to file

Email citations

Send citations to clipboard

Add to Collections

Add to My Bibliography

Create a file for external citation management software

Your saved search

Your RSS Feed

My Custom Filters

Publication date

Text availability

Article attribute

Article type

Article Language

Species

Sex

Age

Other

83 results

Search Page

Filters