Defect engineering of metal-oxide interface for proximity of photooxidation and photoreduction.
Zhou Y, Zhang Z, Fang Z, Qiu M, Ling L, Long J, Chen L, Tong Y, Su W, Zhang Y, Wu JCS, Basset JM, Wang X, Yu G.
Zhou Y, et al. Among authors: qiu m.
Proc Natl Acad Sci U S A. 2019 May 21;116(21):10232-10237. doi: 10.1073/pnas.1901631116. Epub 2019 May 7.
Proc Natl Acad Sci U S A. 2019.
PMID: 31064878
Free PMC article.