New designs and a new analysis technique have been developed for an existing compact charged-particle spectrometer on the NIF and OMEGA. The new analysis technique extends the capabilities of this diagnostic to measure arbitrarily shaped ion spectra down to 1 MeV with yields as low as 106. Three different designs are provided optimized for the measurement of DD protons, T3He deuterons, and 3He3He protons. The designs are highly customizable, and a generalized framework is provided for optimizing the design for alternative applications. Additionally, the understanding of the detector's response and uncertainties is greatly expanded upon. A new calibration procedure is also developed to increase the precision of the measurements.