Continuous wave terahertz spectrometer as a noncontact thickness measuring device

Appl Opt. 2008 Jun 1;47(16):3023-6. doi: 10.1364/ao.47.003023.

Abstract

We present a low cost terahertz (THz) spectrometer with coherent detection based on two simple and robust dipole antennas driven by two laser diodes. The spectrometer covers frequencies up to 1 THz, with a peak signal-to-noise ratio exceeding 40 dB for a lock-in integration time of 30 ms. We demonstrate that the thickness profile of a sample can be reconstructed from an acquired THz image.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Electrodes
  • Electromagnetic Phenomena
  • Equipment Design
  • Lasers
  • Optics and Photonics*
  • Polyethylene / chemistry
  • Quality Control
  • Research Design
  • Spectrophotometry / methods*
  • Temperature
  • Time Factors

Substances

  • Polyethylene