Measurement of the inclusive semielectronic D0 branching fraction
Phys Rev D Part Fields
.
1996 Sep 1;54(5):2994-3005.
doi: 10.1103/physrevd.54.2994.
Authors
Y Kubota
,
M Lattery
,
JK Nelson
,
S Patton
,
R Poling
,
T Riehle
,
V Savinov V
,
R Wang
,
MS Alam
,
IJ Kim
,
Z Ling
,
AH Mahmood
,
JJ O'Neill
,
H Severini
,
CR Sun
,
S Timm
,
F Wappler
,
G Crawford
,
JE Duboscq
,
R Fulton
,
D Fujino
,
KK Gan
,
K Honscheid
,
H Kagan
,
R Kass
,
J Lee
,
M Sung
,
C White
,
R Wanke
,
A Wolf
,
MM Zoeller
,
X Fu
,
B Nemati
,
WR Ross
,
P Skubic
,
M Wood
,
M Bishai
,
J Fast
,
E Gerndt
,
JW Hinson
,
T Miao
,
DH Miller
,
M Modesitt
,
EI Shibata
,
IP Shipsey
,
PN Wang
,
L Gibbons
,
SD Johnson
,
Y Kwon
,
S Roberts
,
EH Thorndike
,
TE Coan
,
J Dominick
,
V Fadeyev V
,
I Korolkov I
,
M Lambrecht
,
S Sanghera
,
V Shelkov V
,
R Stroynowski
,
I Volobouev I
,
G Wei
,
M Artuso
,
M Gao
,
M Goldberg
PMID:
10020978
DOI:
10.1103/physrevd.54.2994
No abstract available